[Analysis Case] Evaluation of Diffusion Layer Shape of Image Sensors Using SCM
We provide consistent support from sample disassembly to measurement.
This document presents case studies evaluating the diffusion layer of image sensors in smartphones. Using a scanning capacitance microscope (SCM) capable of determining the p/n type of semiconductors, we assessed the distribution of the diffusion layer. By combining the results from cross-sectional and planar SCM, we obtained complementary and extensive information. SCM is one of the effective tools for evaluating the quality of image sensor diffusion layers and for failure analysis.
- Company:一般財団法人材料科学技術振興財団 MST
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